Semiconductor & Microelectronics

Defect Detection at the Smallest Scale

From wafer-level processes to advanced packaging, Viscom technologies uncover defects and deviations in even the smallest structures. Detailed inspection of interconnects, bonds, substrates, and internal package features support stable processes and higher yields.

CONTACT US

Semiconductor & Microelectronics

Precision at the Micro Level

The semiconductor and electronics industry rely on advanced inspection technologies to ensure the highest standards of quality, reliability, and performance. From wafer fabrication to advanced packaging, precise inspection is essential to detect defects such as cracks, voids, contamination, and misalignment at an early stage. This includes wafer and die level inspection as well as the analysis of interconnects like microvias, and TSVs, enabling manufacturers to optimize yield and maintain process stability in increasingly complex production environments. 

With the rapid evolution of advanced packaging, inspection plays a critical role in ensuring the integrity of solder balls, bumps, pads, and various bonding technologies such as wire bonding, flip-chip, hybrid, and direct bonding. In addition, 3D inspection of internal package structures and wafer-level process monitoring are key to guaranteeing performance and long-term reliability in high-density and high-performance applications. 

In power electronics and advanced material processing, inspection is equally vital to ensure durability and efficiency. This includes the evaluation of DCB, AMB, and ceramic substrates, as well as sintered and soldered interfaces and bond integrity within power modules. Furthermore, Viscom’s inspection solutions enable precise analysis of advanced materials such as sinter, gold, and silver pastes, supporting accurate volume control, homogeneity, and stable manufacturing processes across a wide range of industrial application. 

Microelectronics Inspection Solutions

From wafer fabrication and advanced packaging to power electronics, Viscom’s advanced 3D X-ray inspection systems and Bond inspection solutions reveal hidden defects across every stage of semiconductor manufacturing. High-resolution inspection ensures maximum yield, reliable interconnections, and consistent quality for next-generation semiconductor devices.

Wafer & Die Level Inspection

We inspect wafer and dies for surface defects, cracks, voids, contaminations, alignment errors, and structural deviations. High-resolution X-ray inspection verifies RDLs, TSVs, vias, and interconnects to ensure precision before assembly. 

Advanced Packaging Inspection

We inspect balls, bumps, pads, wire bonds, flip-chip, hybrid and direct bonding for hidden defects and process deviations. High-resolution 3D X-ray inspection verifies internal package structrues and wafer-level packaging quality. 

Power Electronics Inspection

We inspect DCB, AMB, and ceramic substrates, soldered and sintered interfaces, and power module bonds for voids, delamination, and structural defects. Advanced X-ray inspection ensures bond integrity and reliable power device performance. 

Why choose Viscom?

We make technology safe, reliable and sustainable!

40 Years of Expertise

Four decades of inspection know-how, combining deep industry knowledge with proven innovation to deliver trusted inspection solutions.

100% Defect Detection

Always advancing with the latest inspection solutions to achieve the highest detection rates and support zero-defect manufacturing.

Award-Winning Inspection Solutions

Industry-leading inspection systems recognized worldwide for outstanding performance, precision, and reliability across every production stage.

Contact

FIND THE RIGHT INSPECTION SOLUTION FOR YOUR Manufacturing process

Benefit from Viscom's award-winning inspection technologies and our global support from experts.

Applications

BGA / QFN Inspection

Viscom’s X-ray inspection detects hidden solder joint defects in BGA (Ball Grid Array) and QFN (Quad Flat No-Lead) Components, including voids, solder bridges, and head-in-pillow defects. Precise inspection of concealed connections enables early defect detection in complex SMT assemblies.

 

Read more

Wire Bond Inspection

As Wire Bonding moves toward thinner wires, finer pitches, and high-power applications, defect-free inspection becomes essential, especially in automotive and 5G Electronics.

Read more

Void Inspection

Voids can develop within applications when air, gas, moisture, or contaminants become trapped during the application, dispensing, curing, or manufacturing process.

Read more

ALL applications